RP

Rajay R. Pai

IN Intel: 1 patents #18,218 of 30,777Top 60%
Overall (All Time): #3,563,060 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6477674 Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements Sarah E. Bates, R. Tim Frodsham, Nasser A. Kurd, Anne Meixner, David O'Brien +2 more 2002-11-05