Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12324091 | Component carrier for microwave applications with stack pieces interconnected at an electrically conductive connection interface | Simon Pressler, Heinrich Trischler | 2025-06-03 |
| 12279369 | Electrically connected component carrier stacks with respective cavities and method of manufacturing the same | Bernhard Reitmaier, Erich Schlaffer | 2025-04-15 |
| 12177965 | Component carrier and method of manufacturing a component carrier | Christian Vockenberger, Ahmad Bader ALOTHMAN ALTERKAWI | 2024-12-24 |
| 12112888 | Component carrier with cavity accommodating at least part of driven body being magnetically drivable to move | Gerald Weis, Gerald Weidinger, Patrick Fleischhacker | 2024-10-08 |
| 11864306 | Component carrier with an embedded thermally conductive block and manufacturing method | Erich Schlaffer | 2024-01-02 |
| 11527807 | Electronic device having first and second component carrier parts with cut-outs therein and adhesively joined to form a cavity that supports an electronic component therein | Fabrizio Gentili, Wolfgang Bosch, Erich Schlaffer, Markus Kastelic, Bernhard Reitmaier | 2022-12-13 |
| 11445612 | Component carrier with a dielectric element placed in a cavity and a manufacturing method | Patrick Lenhardt | 2022-09-13 |
| 11322482 | Component carrier with opposed stacks having respective connection bodies and a method for manufacturing the component carrier | Bernhard Reitmaier, Erich Schlaffer | 2022-05-03 |
| 8060800 | Evaluation circuit and method for detecting and/or locating faulty data words in a data stream Tn | Michael Goessel, Andreas Leininger, Heinz Mattes | 2011-11-15 |
| 7945406 | Measuring device and method for measuring relative phase shifts of digital signals | Stephane Kirmser, Heinz Mattes | 2011-05-17 |
| 7912667 | Electrical circuit and method for testing electronic component | Claus Dworski | 2011-03-22 |
| 7720645 | Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device | Stephane Kirmser, Heinz Mattes | 2010-05-18 |
| 7653170 | Electrical circuit for measuring times and method for measuring times | Heinz Mattes, Thomas Piorek, Olaf Stroeble | 2010-01-26 |
| 7558991 | Device and method for measuring jitter | Heinz Mattes | 2009-07-07 |
| 7487060 | Apparatus and method for tolerance analysis for digital and/or digitized measure values | Hans-Dieter Oberle | 2009-02-03 |
| 7471220 | Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit | Heinz Mattes | 2008-12-30 |
| 7400995 | Device and method for testing integrated circuits | Heinz Mattes | 2008-07-15 |
| 7391349 | Test apparatus and method for testing analog/digital converters | Claus Dworski, Heinz Mattes | 2008-06-24 |
| 7256602 | Electrical circuit and method for testing integrated circuits | Heinz Mattes | 2007-08-14 |
| 7254502 | Method and device for detecting period length fluctuations of periodic signals | Hans-Dieter Oberle | 2007-08-07 |
| 7206712 | Test apparatus and test method for mixed-signal semiconductor components | Heinz Mattes | 2007-04-17 |
| 6944810 | Method and apparatus for the testing of input/output drivers of a circuit | Hans-Dieter Oberle | 2005-09-13 |