Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE47805 | Apparatus and method for the characterization of analog-to-digital converters | — | 2020-01-07 |
| 9088294 | Apparatus and method for the characterization of analog-to-digital converters | — | 2015-07-21 |
| 8860592 | Signal generating circuit | Ralf Arnold, Hermann Obermeir | 2014-10-14 |
| 8060800 | Evaluation circuit and method for detecting and/or locating faulty data words in a data stream Tn | Michael Goessel, Andreas Leininger, Sebastian Sattler | 2011-11-15 |
| 7945406 | Measuring device and method for measuring relative phase shifts of digital signals | Stephane Kirmser, Sebastian Sattler | 2011-05-17 |
| 7720645 | Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device | Stephane Kirmser, Sebastian Sattler | 2010-05-18 |
| 7653170 | Electrical circuit for measuring times and method for measuring times | Thomas Piorek, Sebastian Sattler, Olaf Stroeble | 2010-01-26 |
| 7561639 | Method and device for estimating channel properties of a transmission channel | Peter Gregorius, Paul Lindt | 2009-07-14 |
| 7558991 | Device and method for measuring jitter | Sebastian Sattler | 2009-07-07 |
| 7471220 | Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit | Sebastian Sattler | 2008-12-30 |
| 7400995 | Device and method for testing integrated circuits | Sebastian Sattler | 2008-07-15 |
| 7391349 | Test apparatus and method for testing analog/digital converters | Claus Dworski, Sebastian Sattler | 2008-06-24 |
| 7355414 | Test apparatus with low-reflection signal distribution | Ralf Arnold, Klaus Standner | 2008-04-08 |
| 7290022 | Method and filter arrangement for digital recursive filtering in the time domain | Peter Gregorius, Paul Lindt | 2007-10-30 |
| 7256602 | Electrical circuit and method for testing integrated circuits | Sebastian Sattler | 2007-08-14 |
| 7206712 | Test apparatus and test method for mixed-signal semiconductor components | Sebastian Sattler | 2007-04-17 |
| 7154809 | Method for measuring the delay time of a signal line | Peter Gregorius, Paul Lindt | 2006-12-26 |
| 6038295 | Apparatus and method for recording, communicating and administering digital images | — | 2000-03-14 |
| 5834955 | Integrated circuit with memory programmable pad driver | Herbert Eichfeld | 1998-11-10 |
| 5224107 | Method in a parallel test apparatus for semiconductor memories | — | 1993-06-29 |