Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7487060 | Apparatus and method for tolerance analysis for digital and/or digitized measure values | Sebastian Sattler | 2009-02-03 |
| 7453282 | Input and output circuit of an integrated circuit and a method for testing the same | Ralf Arnold, Martin Glas, Christian Mueller | 2008-11-18 |
| 7254502 | Method and device for detecting period length fluctuations of periodic signals | Sebastian Sattler | 2007-08-07 |
| 6944810 | Method and apparatus for the testing of input/output drivers of a circuit | Sebastian Sattler | 2005-09-13 |
| RE36061 | Integrated semiconductor memory | Kurt Hoffmann, Oskar Kowarik, Rainer Kraus, Bernhard Lustig | 1999-01-26 |
| 5497350 | Integrated semiconductor memory device capable of switching from a memory mode to an internal test mode | Peter Muhmenthaler | 1996-03-05 |
| 5293386 | Integrated semiconductor memory with parallel test capability and redundancy method | Peter Muhmenthaler, Martin Peisl, Dominique Savignac | 1994-03-08 |
| 5253209 | Integrated semiconductor memory | Kurt Hoffmann, Oskar Kowarik, Rainer Kraus, Bernhard Lustig | 1993-10-12 |
| 4956819 | Circuit configuration and a method of testing storage cells | Kurt Hoffmann, Rainer Kraus, Oskar Kowarik | 1990-09-11 |
| 4922134 | Testable redundancy decoder of an integrated semiconductor memory | Kurt Hoffmann, Oskar Kowarik, Rainer Kraus, Bernhard Lustig | 1990-05-01 |
| 4885748 | Method and circuit configuration of the parallel input of data into a semiconductor memory | Kurt Hoffmann, Rainer Kraus, Oskar Kowarik, Manfred Paul | 1989-12-05 |