Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6806550 | Evaluation configuration for semiconductor memories | Kurt Hoffmann | 2004-10-19 |
| 6768667 | Semiconductor memory device | Kurt Hoffmann | 2004-07-27 |
| 6747891 | Circuit for non-destructive, self-normalizing reading-out of MRAM memory cells | Kurt Hoffmann | 2004-06-08 |
| 6627935 | Resistive ferroelectric memory cell | Kurt Hoffman | 2003-09-30 |
| 6480044 | Semiconductor circuit configuration | Georg Braun, Heinz Honigschmid, Kurt Hoffmann | 2002-11-12 |
| 6452830 | Memory configuration including a plurality of resistive ferroelectric memory cells | Kurt Hoffmann | 2002-09-17 |
| 6407945 | Method for reading nonvolatile semiconductor memory configurations | Andreas von Schwerin, Franz Schuler | 2002-06-18 |
| 6404668 | Memory configuration including a plurality of resistive ferroelectric memory cells | Kurt Hoffmann | 2002-06-11 |
| 6392918 | Circuit configuration for generating a reference voltage for reading a ferroelectric memory | Georg Braun, Heinz Honigschmid, Kurt Hoffmann, Thomas Rohr | 2002-05-21 |
| 6388917 | Method for nondestructively reading memory cells of an MRAM memory | Kurt Hoffmann | 2002-05-14 |
| 6317356 | Configuration for self-referencing ferroelectric memory cells | Kurt Hoffmann | 2001-11-13 |
| RE36061 | Integrated semiconductor memory | Kurt Hoffmann, Rainer Kraus, Bernhard Lustig, Hans-Dieter Oberle | 1999-01-26 |
| 5774014 | Integrated buffer circuit which functions independently of fluctuations on the supply voltage | Johannes Stecker, Klaus Luther, Kurt Hoffmann | 1998-06-30 |
| 5276643 | Integrated semiconductor circuit | Kurt Hoffmann, Rainer Kraus | 1994-01-04 |
| 5253209 | Integrated semiconductor memory | Kurt Hoffmann, Rainer Kraus, Bernhard Lustig, Hans-Dieter Oberle | 1993-10-12 |
| 5184326 | Integrated semiconductor memory of the dram type and method for testing the same | Kurt Hoffmann, Rainer Kraus | 1993-02-02 |
| 5030861 | Gate circuit having MOS transistors | Kurt Hoffmann, Rainer Kraus | 1991-07-09 |
| 4956819 | Circuit configuration and a method of testing storage cells | Kurt Hoffmann, Hans-Dieter Oberle, Rainer Kraus | 1990-09-11 |
| 4922134 | Testable redundancy decoder of an integrated semiconductor memory | Kurt Hoffmann, Rainer Kraus, Bernhard Lustig, Hans-Dieter Oberle | 1990-05-01 |
| 4906994 | Multi-stage integrated decoder device | Kurt Hoffmann, Rainer Kraus, Manfred Paul | 1990-03-06 |
| 4896322 | Circuit configuration and a method for the testing of storage cells | Rainer Kraus, Kurt Hoffmann, Manfred Paul | 1990-01-23 |
| 4885748 | Method and circuit configuration of the parallel input of data into a semiconductor memory | Kurt Hoffmann, Hans-Dieter Oberle, Rainer Kraus, Manfred Paul | 1989-12-05 |
| 4855621 | Multi-stage, integrated decoder device having redundancy test enable | Kurt Hoffmann, Rainer Kraus | 1989-08-08 |
| 4803386 | Digital amplifier configuration in integrated circuits | Rainer Kraus, Manfred Paul | 1989-02-07 |