Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10503487 | System and method for deploying and controlling mobile operating system on a platform | Chuan-Yu Cho, Ping-Hsien Chi, Po-Wen Cheng | 2019-12-10 |
| 9778756 | Optical sensor module utilizing optical designs to adjust gesture sensitive region, and related mobile apparatus | Hsin-Yueh Sung, Yi-Yung Chen, Tom Chang, Kao-Pin Wu, Cheng-Ta Chuang | 2017-10-03 |
| 9569011 | Optical sensor module utilizing optical designs to adjust gesture sensitive region, and related mobile apparatus | Hsin-Yueh Sung, Tom Chang, Kao-Pin Wu, Cheng-Ta Chuang | 2017-02-14 |
| 8699021 | System, method and computer readable medium for through silicon via structure measurement | Yi-Sha Ku | 2014-04-15 |
| 8537213 | Method for measuring via bottom profile | Deh-Ming Shyu, Yi-Sha Ku | 2013-09-17 |
| 8386969 | Method for designing overlay targets and method and system for measuring overlay error using the same | Yi-Sha Ku | 2013-02-26 |
| 8321821 | Method for designing two-dimensional array overlay targets and method and system for measuring overlay errors using the same | Yi-Sha Ku, Hsiu Lan Pang, Deh-Ming Shyu | 2012-11-27 |
| 8250497 | Method for designing two-dimensional array overlay target sets and method and system for measuring overlay errors using the same | Yi-Sha Ku, Hsiu Lan Pang, Deh-Ming Shyu | 2012-08-21 |
| 8139233 | System and method for via structure measurement | Yi-Sha Ku, Hsiu Lan Pang, Deh-Ming Shyu | 2012-03-20 |
| 7872741 | Method and apparatus for scatterfield microscopical measurement | Sen-Yih Chou, Shu-Ping Dong, Deh-Ming Shyu, Chia-Lin Wu, Yi-Sha Ku +1 more | 2011-01-18 |
| 7864324 | Reflective scatterometer | Deh-Ming Shyu, Yi-Sha Ku, Sen-Yih Chou, Shu-Ping Dong | 2011-01-04 |
| 6041393 | Array padding for higher memory throughput in the presence of dirty misses | — | 2000-03-21 |