AG

Anne-Marie Goethals

IM Imec: 3 patents #122 of 687Top 20%
Samsung: 1 patents #49,284 of 75,807Top 70%
Overall (All Time): #1,521,256 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9086638 Detection of contamination in EUV systems Rik Jonckheere, Gian Francesco Lorusso, Ivan Pollentier 2015-07-21
8006202 Systems and methods for UV lithography Gian Francesco Lorusso, In-Sung Kim, Byeong-Soo Kim, Rik Jonckheere, Jan Hermans 2011-08-23
7750319 Method and system for measuring contamination of a lithographical element Gian Francesco Lorusso, Rik Jonckheere, Jan Hermans 2010-07-06