Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5420520 | Method and apparatus for testing of integrated circuit chips | Morris Anschel, Anthony P. Ingraham, Charles Robert Lamb, Michael D. Lowell, Voya R. Markovich +7 more | 1995-05-30 |
| 4975079 | Connector assembly for chip testing | Brian S. Beaman, Keith E. Fogel, Jungihl Kim, Jane M. Shaw, George F. Walker | 1990-12-04 |