Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8927411 | System and method for forming an aluminum fuse for compatibility with copper BEOL interconnect scheme | Felix P. Anderson, Timothy H. Daubenspeck, Jeffrey P. Gambino, Donald R. Letourneau, Thomas L. McDevitt +1 more | 2015-01-06 |
| 8921975 | System and method for forming aluminum fuse for compatibility with copper BEOL interconnect scheme | Felix P. Anderson, Timothy H. Daubenspeck, Jeffrey P. Gambino, Donald R. Letourneau, Thomas L. McDevitt +1 more | 2014-12-30 |
| 6980937 | Method and system for quantifying the step profile characteristics semiconductor features using surface analysis data | — | 2005-12-27 |
| 6864189 | Methodology for measuring and controlling film thickness profiles | Michael C. Triplett | 2005-03-08 |
| 6774019 | Incorporation of an impurity into a thin film | Charles Choate, Michael Lunn, Paul Nisson, Dean W. Siegel, Michael C. Triplett | 2004-08-10 |
| 6724947 | Method and system for measuring characteristics of curved features | — | 2004-04-20 |