| 6998865 |
Semiconductor device test arrangement with reassignable probe pads |
Karen Bard |
2006-02-14 |
| 6781436 |
Programming transistor in breakdown mode with current compliance |
Chandrasekharan Kothandaraman |
2004-08-24 |
| 6710640 |
Active well-bias transistor for programming a fuse |
Chandrasekharan Kothandaraman |
2004-03-23 |
| 6670675 |
Deep trench body SOI contacts with epitaxial layer formation |
Herbert L. Ho, Babar A. Khan, Robert Hannon |
2003-12-30 |
| 6624499 |
System for programming fuse structure by electromigration of silicide enhanced by creating temperature gradient |
Chandrasekharan Kothandaraman, Subramanian S. Iyer, Chandrasekhar Narayan |
2003-09-23 |
| 6486043 |
Method of forming dislocation filter in merged SOI and non-SOI chips |
Robert Hannon, Herbert L. Ho, Subramanian S. Iyer |
2002-11-26 |
| 6096580 |
Low programming voltage anti-fuse |
Liang Han, Robert Hannon, Subramanian S. Iyer, Mukesh V. Khare |
2000-08-01 |
