Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6344698 | More robust alignment mark design | Robert T. Froebel, Paul D. Sonntag | 2002-02-05 |
| 5776645 | Lithographic print bias/overlay target and applied metrology | Patrick J. Couillard | 1998-07-07 |
| 5756238 | Lithographic print bias/overlay target and applied metrology | Patrick J. Couillard | 1998-05-26 |
| 5677091 | Lithographic print bias/overlay target and applied metrology | Patrick J. Couillard | 1997-10-14 |