PC

Patrick J. Couillard

IBM: 3 patents #26,272 of 70,183Top 40%
Overall (All Time): #1,639,101 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5776645 Lithographic print bias/overlay target and applied metrology Roger Lawrence Barr 1998-07-07
5756238 Lithographic print bias/overlay target and applied metrology Roger Lawrence Barr 1998-05-26
5677091 Lithographic print bias/overlay target and applied metrology Roger Lawrence Barr 1997-10-14