Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6258710 | Sub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivity | Hazara S. Rathore, Hormazdyar M. Dalal, Du Nguyen, Richard G. Smith, Alexander J. Swinton +1 more | 2001-07-10 |
| 6069068 | Sub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivity | Hazara S. Rathore, Hormazdyar M. Dalal, Du Nguyen, Richard G. Smith, Alexander J. Swinton +1 more | 2000-05-30 |