Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6522154 | Oxide tracking voltage reference | John A. Fifield, Mark D. Jacunski, Thomas M. Maffitt | 2003-02-18 |
| 6496027 | System for testing integrated circuit devices | Joseph C. Sher, David D. Siek, Huy T. Vo, Victor Wong, Hua Zheng | 2002-12-17 |