KG

Kevin C. Gower

IBM: 138 patents #337 of 70,183Top 1%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
📍 Lagrangeville, NY: #2 of 200 inventorsTop 1%
🗺 New York: #288 of 115,490 inventorsTop 1%
Overall (All Time): #7,400 of 4,157,543Top 1%
138
Patents All Time

Issued Patents All Time

Showing 126–138 of 138 patents

Patent #TitleCo-InventorsDate
6757857 Alternating current built in self test (AC BIST) with variable data receiver voltage reference for performing high-speed AC memory subsystem self-test Kirk D. Lamb, Paul W. Coteus 2004-06-29
6671753 Elastic interface apparatus and method therefor Daniel M. Dreps, Frank D. Ferraiolo 2003-12-30
6662136 Digital temperature sensor (DTS) system to monitor temperature in a memory subsystem Kirk D. Lamb 2003-12-09
6654897 Dynamic wave-pipelined interface apparatus and methods therefor Daniel M. Dreps, Frank D. Ferraiolo 2003-11-25
6571346 Elastic interface for master-slave communication Daniel M. Dreps, Frank D. Ferraiolo, Bradley McCredie, Paul W. Coteus 2003-05-27
6542999 System for latching first and second data on opposite edges of a first clock and outputting both data in response to a second clock Daniel M. Dreps, Frank D. Ferraiolo 2003-04-01
6515917 DIGITAL-TO-ANALOG CONVERTER (DAC) FOR DYNAMIC ADJUSTMENT OF OFF-CHIP DRIVER PULL-UP AND PULL DOWN IMPEDANCE BY PROVIDING A VARIABLE REFERENCE VOLTAGE TO HIGH FREQUENCY RECEIVER AND DRIVER CIRCUITS FOR COMMERCIAL MEMORY Kirk D. Lamb, Edward N. Cohen 2003-02-04
6489912 Analog-to-digital converter for monitoring VDDQ and dynamically updating programmable Vref when using high-frequency receiver and driver circuits for commercial memory Kirk D. Lamb 2002-12-03
6442223 Method and system for data transfer Daniel M. Dreps, Frank D. Ferraiolo, Toru Kobayashi, Bradley McCredie, Hideo Sawamoto 2002-08-27
6434731 Automated placement of signal distribution to diminish skew among same capacitance targets in integrated circuits Thomas Brennan, Daniel John Kolor, Erik Victor Kusko 2002-08-13
6421784 Programmable delay circuit having a fine delay element selectively receives input signal and output signal of coarse delay element Albert M. Chu, Daniel M. Dreps, Frank D. Ferraiolo, Roger P. Gregor 2002-07-16
6334163 Elastic interface apparatus and method therefor Daniel M. Dreps, Frank D. Ferraiolo 2001-12-25
5357523 Memory testing system with algorithmic test data generation Richard Bogholtz, Jr., Louis J. Bosch, Thomas Mitchell 1994-10-18