Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5392294 | Diagnostic tool and method for locating the origin of parasitic bit faults in a memory array | Royle K. Smith | 1995-02-21 |
| 5357523 | Memory testing system with algorithmic test data generation | Richard Bogholtz, Jr., Kevin C. Gower, Thomas Mitchell | 1994-10-18 |
| 5195097 | High speed tester | Richard Bogholtz, Jr., Thomas Mitchell | 1993-03-16 |
| 4730318 | Modular organized storage tester | Richard Bogholtz, Jr. | 1988-03-08 |