Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6847203 | Applying parametric test patterns for high pin count ASICs on low pin count testers | Dennis R. Conti | 2005-01-25 |
| 6304841 | Automatic construction of conditional exponential models from elementary features | Adam L. Berger, Peter F. Brown, Stephen Andrew Della Pietra, Vincent J. Della Pietra, Robert L. Mercer | 2001-10-16 |