Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8592308 | Silicided device with shallow impurity regions at interface between silicide and stressed liner | Christian Lavoie, Ahmet S. Ozcan | 2013-11-26 |
| 7881891 | Automated dynamic metrology sampling system and method for process control | Marc J. Postiglione, Eric P. Solecky | 2011-02-01 |
| 7487054 | Automated dynamic metrology sampling system and method for process control | Marc J. Postiglione, Eric P. Solecky | 2009-02-03 |