Gary W. Behm — 17 Patents at IBM

Gary W. Behm has been granted 17 US patents while listed as an inventor at IBM. The first was granted in 2006 and the most recent in April 2025. Gary W. Behm ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Gary W. Behm in West Henrietta, NY, US.

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12267457	Method and system to enhance communication between multiple parties	Brian Trager, Shareef Ali, Mark Jeremy, Byron Behm	2025-04-01
11012559	Method and system to enhance communication between multiple parties	Brian Trager, Shareef Ali, Mark Jeremy, Byron Behm	2021-05-18
8842021	Methods and systems for early warning detection of emergency vehicles	William B. Huber, Alfred J. Noll, Raul A. Pelaez	2014-09-23	$6,171,000
8565910	Manufacturing execution system (MES) including a wafer sampling engine (WSE) for a semiconductor manufacturing process	Malek Ben Salem, Yue Li	2013-10-22	$5,163,000
8229691	Method for using real-time APC information for an enhanced lot sampling engine	Malek Ben Salem, Yue Li	2012-07-24	$4,383,000
8130262	Apparatus and method for enhancing field of vision of the visually impaired	Alfred J. Noll, Richard E. Von Mering	2012-03-06	$5,131,000
8077020	Method and apparatus for tactile haptic device to guide user in real-time obstacle avoidance	Richard E. Von Mering	2011-12-13	$19,280,000
7899566	Factory level and tool level advanced process control systems integration implementation	Emily M. Hwang, Yue Li, Teresita Q. Magtoto	2011-03-01	$4,705,000
7895008	Method of performing measurement sampling of lots in a manufacturing process	Yue Li, Malek Ben Salem, Keith H. Tabakman	2011-02-22	$3,876,000
7778112	Apparatus and method for sensing of three-dimensional environmental information	Richard E. Von Mering	2010-08-17	$4,695,000
7700378	Method and system for line-dimension control of an etch process	Teresita Q. Magtoto, Rajiv Ranade	2010-04-20	$4,962,000
7577537	Providing a dynamic sampling plan for integrated metrology	Emily M. Hwang, Yue Li, Teresita Q. Magtoto, Derek C. Stoll	2009-08-18	$24,774,000
7509186	Method and system for reducing the variation in film thickness on a plurality of semiconductor wafers having multiple deposition paths in a semiconductor manufacturing process	Yue Li, James V. Iannucci, Derek C. Stoll	2009-03-24	$7,908,000
7489980	Factory level and tool level advanced process control systems integration implementation	Emily M. Hwang, Yue Li, Teresita Q. Magtoto	2009-02-10	$5,620,000
7398172	Method and system of providing a dynamic sampling plan for integrated metrology	Emily M. Hwang, Yue Li, Teresita Q. Magtoto, Derek C. Stoll	2008-07-08	$9,414,000
7291285	Method and system for line-dimension control of an etch process	Teresita Q. Magtoto, Rajiv Ranade	2007-11-06	$19,194,000
7113845	Integration of factory level and tool level advanced process control systems	Yue Li, Emily M. Hwang, Teresita Q. Magtoto	2006-09-26	$6,900,000

Gary W. Behm — 17 Patents

Issued Patents All Time

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