Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8465657 | Post chemical mechanical polishing etch for improved time dependent dielectric breakdown reliability | Kaushik Chanda, James J. Demarest, Ronald G. Filippi, Roy Iggulden, Ping-Chuan Wang +1 more | 2013-06-18 |