Issued Patents All Time
Showing 26–40 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D855633 | Display screen with graphical user interface for a search engine result page | Lai Wei, Xiaocong HE, Jiarui Jiang, Na Xun, Xiaoyu Wang +1 more | 2019-08-06 |
| 10334035 | Load balancing based on user behavior prediction | Xiao Hua Shen, Ling Tony Chen, Li Zhang, Min Zhou | 2019-06-25 |
| 9740699 | File creation with location limitation capability in storage cluster environments | Ling Tony Chen, Li Zhang, Min Zhou | 2017-08-22 |
| 9195730 | Verifying correctness of a database system via extended access paths | Yan Jia, Shu Hua Liu, Ke Wei Wei, Xin Ying Yang, Jing Zhou +1 more | 2015-11-24 |
| 9110946 | Database query optimization | Shu Hua Liu, Xin Ying Yang, Miao Zheng | 2015-08-18 |
| 8935200 | Dynamic database dump | Yan Jia, Shu Hua Liu, Xiang Zhou | 2015-01-13 |
| 6318159 | Scanning force microscope with automatic surface engagement | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 2001-11-20 |
| 6234009 | Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 2001-05-22 |
| 6220084 | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 2001-04-24 |
| 6169281 | Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions | Edwin Flecha, James Michael Hammond, Yves Martin, Kenneth Gilbert Roessler | 2001-01-02 |
| 6167753 | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 2001-01-02 |
| 6079254 | Scanning force microscope with automatic surface engagement and improved amplitude demodulation | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 2000-06-27 |
| 5918274 | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 1999-06-29 |
| 5907096 | Detecting fields with a two-pass, dual-amplitude-mode scanning force microscope | — | 1999-05-25 |
| 5902928 | Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator | Edwin Flecha, James Michael Hammond, Kenneth Gilbert Roessler | 1999-05-11 |