Issued Patents All Time
Showing 51–64 of 64 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7881089 | Coding techniques for improving the sense margin in content addressable memories | Michele M. Franceschini, Chung H. Lam, Luis A. Lastras | 2011-02-01 |
| 7872889 | High density ternary content addressable memory | Chung H. Lam | 2011-01-18 |
| 7868313 | Phase change memory device and method of manufacture | Matthew J. Breitwisch, Chung H. Lam, Hsiang-Lan Lung, Alejandro G. Schrott, Yu Zhu | 2011-01-11 |
| 7863610 | Integrated circuit including silicide region to inhibit parasitic currents | Shoaib Hasan.Zaidi | 2011-01-04 |
| 7811879 | Process for PCM integration with poly-emitter BJT as access device | Chung H. Lam | 2010-10-12 |
| 7782646 | High density content addressable memory using phase change devices | Chung H. Lam | 2010-08-24 |
| 7764533 | Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition | Matthew J. Breitwisch, Chung H. Lam | 2010-07-27 |
| 7751217 | Content addressable memory using phase change devices | Chung H. Lam, Brian L. Ji, Robert K. Montoye | 2010-07-06 |
| 7639527 | Phase change memory dynamic resistance test and manufacturing methods | Ming-Hsiu Lee, Chung H. Lam | 2009-12-29 |
| 7606067 | Method to create a uniformly distributed multi-level cell (MLC) bitstream from a non-uniform MLC bitstream | Chung H. Lam | 2009-10-20 |
| 7602631 | Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition | Matthew J. Breitwisch, Chung H. Lam | 2009-10-13 |
| 7602632 | Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition | Matthew J. Breitwisch, Chung H. Lam | 2009-10-13 |
| 7567473 | Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition | Matthew J. Breitwisch, Chung H. Lam | 2009-07-28 |
| 7505334 | Measurement method for reading multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition | Matthew J. Breitwisch, Chung H. Lam | 2009-03-17 |