Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6838675 | Specimen observation system for applying external magnetic field | Ken Harada, Junji Endo | 2005-01-04 |
| 5814815 | Phase-contrast electron microscope and phase plate therefor | Takao Matsumoto, Akira Tonomura | 1998-09-29 |
| 5811805 | Charged particle guide apparatus and image viewing apparatus for charged particle microscope using the same | Junji Endo, Tetsuji Kodama, Tsuneyuki Urakami, Hiroshi Tsuchiya, Shinji Ohsuka | 1998-09-22 |
| 5192867 | Electron optical measurement apparatus | Junji Endo, Akira Tonomura, Masahiro Tomita, Tadao Furutsu | 1993-03-09 |
| 4998788 | Reflection electron holography apparatus | Akira Tonomura | 1991-03-12 |
| 4935625 | Electron holography apparatus | Shuji Hasegawa, Junji Endo, Akira Tonomura | 1990-06-19 |
| 4642461 | Field emission type electron microscope using a multi-stage acceleration tube | Junji Endo, Akira Tonomura, Susumu Ozasa, Tsuyoshi Matsuda, Chikara Kimura | 1987-02-10 |