Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5814815 | Phase-contrast electron microscope and phase plate therefor | Takao Matsumoto, Nobuyuki Osakabe | 1998-09-29 |
| 5446589 | Interference device and method for observing phase informalities | Qing X. Ru, Junji Endo | 1995-08-29 |
| 5426521 | Aberration correction method and aberration correction apparatus | Jun-Horng Chen, Guanming Lai, Kazuo Ishizuka | 1995-06-20 |
| 5192867 | Electron optical measurement apparatus | Nobuyuki Osakabe, Junji Endo, Masahiro Tomita, Tadao Furutsu | 1993-03-09 |
| 4998788 | Reflection electron holography apparatus | Nobuyuki Osakabe | 1991-03-12 |
| 4945247 | Field emission electron gun system | Takeshi Kawasaki, Junji Endo, Shigeto Isakozawa, Masahiro Tomita | 1990-07-31 |
| 4935625 | Electron holography apparatus | Shuji Hasegawa, Junji Endo, Nobuyuki Osakabe | 1990-06-19 |
| 4748132 | Micro fabrication process for semiconductor structure using coherent electron beams | Tadashi Fukuzawa, Naoki Chinone | 1988-05-31 |
| 4642461 | Field emission type electron microscope using a multi-stage acceleration tube | Junji Endo, Susumu Ozasa, Tsuyoshi Matsuda, Chikara Kimura, Nobuyuki Osakabe | 1987-02-10 |
| 4532422 | Electron holography microscope | Setsuo Nomura, Nobuo Hamamoto, Akira Fukuhara | 1985-07-30 |