Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA +6 more | 2022-07-05 |
| 8344382 | Semiconductor device, manufacturing method thereof, and display apparatus using the semiconductor device | Junichi Hanna, Isao Suzumura, Mieko Matsumura, Mutsuko Hatano, Kenichi Onisawa +2 more | 2013-01-01 |
| 6656838 | Process for producing semiconductor and apparatus for production | Tomoji Watanabe, Tadanori Yoshida | 2003-12-02 |
| 6403479 | Process for producing semiconductor and apparatus for production | Tomoji Watanabe, Tadanori Yoshida | 2002-06-11 |