Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8713710 | Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus | Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Tsuneo Nakagomi, Shinji Honma +2 more | 2014-04-29 |