Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5920067 | Monocrystalline test and reference structures, and use for calibrating instruments | Michael W. Cresswell, R. N. Ghoshtagore, Loren W. Linholm, Richard A. Allen, Jeffry J. Sniegowski +1 more | 1999-07-06 |
| 5857258 | Electrical test structure and method for measuring the relative locations of conductive features on an insulating substrate | Richard A. Allen, Michael W. Cresswell, Loren W. Linholm, E. Clayton Teague | 1999-01-12 |
| 5602492 | Electrical test structure and method for measuring the relative locations of conducting features on an insulating substrate | Michael W. Cresswell, Loren W. Linholm, Richard A. Allen, E. Clayton Teague | 1997-02-11 |
| 5373232 | Method of and articles for accurately determining relative positions of lithographic artifacts | Michael W. Cresswell, Richard A. Allen, Loren W. Linholm, Colleen H. Ellenwood, E. Clayton Teague | 1994-12-13 |