Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5920067 | Monocrystalline test and reference structures, and use for calibrating instruments | Michael W. Cresswell, Loren W. Linholm, Richard A. Allen, Jeffry J. Sniegowski, William B. Penzes +1 more | 1999-07-06 |
| 5684301 | Monocrystalline test structures, and use for calibrating instruments | Michael W. Cresswell, Loren W. Linholm, Richard A. Allen, Jeffry J. Sniegowski | 1997-11-04 |