Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9613874 | Methods for evaluating semiconductor device structures | Jie Zhu, Binghai Liu, Si Ping Zhao, Jeffrey Lam | 2017-04-04 |
| 9581506 | Methods for evaluating strain of crystalline devices | Jie Zhu, Binghai Liu, Si Ping Zhao, Jeffrey Lam | 2017-02-28 |
| 6683304 | Method for a plan-view transmission electron microscopy sample preparation technique for via and contact characterization | Dai Jiyan, Tee Siam Foong, Tai Chui Lam, Shailesh Redkar | 2004-01-27 |