Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6683304 | Method for a plan-view transmission electron microscopy sample preparation technique for via and contact characterization | Dai Jiyan, Tee Siam Foong, Eddie Er, Shailesh Redkar | 2004-01-27 |