Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11145556 | Method and device for inspection of semiconductor samples | — | 2021-10-12 |
| 9613874 | Methods for evaluating semiconductor device structures | Jie Zhu, Binghai Liu, Eddie Er, Jeffrey Lam | 2017-04-04 |
| 9581506 | Methods for evaluating strain of crystalline devices | Jie Zhu, Binghai Liu, Eddie Er, Jeffrey Lam | 2017-02-28 |