BB

Bharat Bhushan

Micron: 11 patents #1,364 of 6,345Top 25%
OU Ohio State University: 11 patents #10 of 584Top 2%
GP Globalfoundries Singapore Pte.: 11 patents #70 of 828Top 9%
IN Intel: 10 patents #4,046 of 30,777Top 15%
QU Qualcomm: 5 patents #3,272 of 12,104Top 30%
EC Emc Ip Holding Company: 5 patents #910 of 4,608Top 20%
FS Freeescale Semiconductor: 3 patents #982 of 3,767Top 30%
MT Mechanical Technology: 3 patents #19 of 79Top 25%
CS Cadence Design Systems: 3 patents #541 of 2,263Top 25%
OF Ohio State Innovation Foundation: 3 patents #130 of 979Top 15%
VT Vlsi Technology: 3 patents #168 of 594Top 30%
Northwestern University: 1 patents #1,629 of 3,846Top 45%
CS Citrix Systems: 1 patents #814 of 1,302Top 65%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
OU Ohio University: 1 patents #95 of 205Top 50%
IBM: 1 patents #44,794 of 70,183Top 65%
Overall (All Time): #23,988 of 4,157,543Top 1%
77
Patents All Time

Issued Patents All Time

Showing 51–75 of 77 patents

Patent #TitleCo-InventorsDate
7023220 Method for measuring nm-scale tip-sample capacitance Jonathan P. Pelz, David Lee 2006-04-04
6856145 Direct, low frequency capacitance measurement for scanning capacitance microscopy Jonathan P. Pelz, David Lee 2005-02-15
6826588 Method and apparatus for a fast comparison in redundant form arithmetic Edward T. Grochowski, Vinod Sharma, John H. Crawford 2004-11-30
6813628 Method and apparatus for performing equality comparison in redundant form arithmetic Edward T. Grochowski, Vinod Sharma, John H. Crawford 2004-11-02
6763368 Method and apparatus for performing single-cycle addition or subtraction and comparison in redundant form arithmetic Vinod Sharma, Edward T. Grochowski, John H. Crawford 2004-07-13
6756791 Method for measuring film thickness using capacitance technique Christopher D. Hahm 2004-06-29
6754689 Method and apparatus for performing subtraction in redundant form arithmetic Edward T. Grochowski, John H. Crawford 2004-06-22
6724199 Pin and cup devices for measuring film thickness Christopher D. Hahm 2004-04-20
6717419 Liquid dielectric capacitor for film thickness mapping Christopher D. Hahm 2004-04-06
6647455 On-die cache memory with repeaters Kenneth R. Smits 2003-11-11
6631444 Cache architecture for pipelined operation with on-die processor Kenneth R. Smits, Mahadevamurty Nemani 2003-10-07
6559680 Data driven keeper for a domino circuit Vivek Joshi 2003-05-06
6504386 Liquid dielectric capacitor for film thickness mapping, measurement methods using same Christopher D. Hahm 2003-01-07
6459280 Capacitance devices for film thickness mapping, measurement methods using same Christopher D. Hahm 2002-10-01
6404207 Scanning capacitance device for film thickness mapping featuring enhanced lateral resolution, measurement methods using same 2002-06-11
6327646 Translation look-aside buffer utilizing high-order bits for fast access Vinod Sharma 2001-12-04
6191618 Contention-free, low clock load domino circuit topology Eric S. Gayles, Debashree Ghosh 2001-02-20
6007896 Surfaces having optimized skewness and kurtosis parameters for reduced static and kinetic friction 1999-12-28
5737229 Method of texturing a magnetic recording medium for optimum skewness and kurtosis to reduce friction with a magnetic head 1998-04-07
5558903 Method for coating fullerene materials for tribology James Coe, Balkishan Malay Gupta 1996-09-24
5523723 Low noise low voltage phase lock loop Christopher G. Arcus, Paul Ta 1996-06-04
5515012 Very low noise, wide frequency range phase lock loop Christopher G. Arcus, Paul Ta 1996-05-07
5391518 Method of making a field programmable read only memory (ROM) cell using an amorphous silicon fuse with buried contact polysilicon and metal electrodes 1995-02-21
4274683 Support element for compliant hydrodynamic journal bearings Stanley Gray 1981-06-23
4269426 Tractor/trailer safety device 1981-05-26