Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7023220 | Method for measuring nm-scale tip-sample capacitance | David Lee, Bharat Bhushan | 2006-04-04 |
| 6856145 | Direct, low frequency capacitance measurement for scanning capacitance microscopy | David Lee, Bharat Bhushan | 2005-02-15 |