Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8717842 | Multi-port memory based on DRAM core | Takaaki Suzuki | 2014-05-06 |
| 8547776 | Multi-port memory based on DRAM core | Takaaki Suzuki | 2013-10-01 |
| 8077537 | Memory device, memory controller and memory system | Tomohiro Kawakubo, Syusaku Yamaguchi, Hitoshi Ikeda, Toshiya Uchida, Hiroyuki Kobayashi +8 more | 2011-12-13 |
| 8015389 | Memory device, memory controller and memory system | Takahiko Sato, Toshiya Uchida, Tatsuya Kanda, Tetsuo Miyamoto, Satoru Shirakawa +5 more | 2011-09-06 |
| 8004921 | Memory device, memory controller and memory system | Tomohiro Kawakubo, Syusaku Yamaguchi, Hitoshi Ikeda, Toshiya Uchida, Hiroyuki Kobayashi +8 more | 2011-08-23 |
| 7911825 | Multi-port memory based on DRAM core | Yasurou Matsuzaki, Takaaki Suzuki, Masafumi Yamazaki, Kenichi Kawasaki, Ayako Sato +1 more | 2011-03-22 |
| 7814294 | Memory device, memory controller and memory system | Takahiko Sato, Toshiya Uchida, Tatsuya Kanda, Tetsuo Miyamoto, Satoru Shirakawa +5 more | 2010-10-12 |
| 7774577 | Memory device, memory controller and memory system | Takahiko Sato, Toshiya Uchida, Tatsuya Kanda, Tetsuo Miyamoto, Satoru Shirakawa +5 more | 2010-08-10 |
| 7729200 | Memory device, memory controller and memory system | Hitoshi Ikeda, Takahiko Sato, Tatsuya Kanda, Toshiya Uchida, Hiroyuki Kobayashi +7 more | 2010-06-01 |
| 7668040 | Memory device, memory controller and memory system | Hitoshi Ikeda, Takahiko Sato, Tatsuya Kanda, Toshiya Uchida, Hiroyuki Kobayashi +7 more | 2010-02-23 |
| 7323789 | Multiple chip package and IC chips | Fusao Seki, Tatsushi Otsuka, Masanori Kurita, Toshiya Uchida, Hiroyoshi Tomita +1 more | 2008-01-29 |
| 7120761 | Multi-port memory based on DRAM core | Yasurou Matsuzaki, Takaaki Suzuki, Masafumi Yamazaki, Kenichi Kawasaki, Ayako Sato +1 more | 2006-10-10 |
| 6661728 | Supply voltage generating circuit and semiconductor memory device using same | Hiroyoshi Tomita | 2003-12-09 |
| 6063640 | Semiconductor wafer testing method with probe pin contact | Masataka Mizukoshi, Hidehiko Akasaki, Masao Nakano, Yasuhiro Fujii, Makoto Yanagisawa +4 more | 2000-05-16 |
| 5412615 | Semiconductor integrated circuit device | Hiromi Noro, Yoshinori Okajima | 1995-05-02 |
| 5280456 | Semiconductor memory device enabling change of output organization with high speed operation | Yoshinori Okajima, Yoshihide Sato | 1994-01-18 |
| 5075581 | ECL to TTL voltage level converter using CMOS and BiCMOS circuitry | — | 1991-12-24 |