TY

Toyonobu Yamada

Fujitsu Limited: 5 patents #6,029 of 24,456Top 25%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
TS Toshiba Industrial Products And Systems: 4 patents #9 of 65Top 15%
FL Fujitsu Vlsi Limited: 1 patents #91 of 256Top 40%
TM Toshiba Industrial Products Manufacturing: 1 patents #23 of 46Top 50%
📍 Somalomo, CM: #138 of 1,329 inventorsTop 15%
Overall (All Time): #377,392 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
10532387 Progressive processing method Yoshihiro Tsukamoto, Youichi Seo, Chidai Isaka 2020-01-14
10536059 Apparatus for manufacturing iron core for rotating electric machine Takayuki Akatsuka, Naoya Fujita, Masanori Ihori 2020-01-14
10505406 Skewed stator cores for improved torque and efficiency Hiroshi Takahashi, Yasuhito Ueda, Takahiro Kokubo, Yoshiro Shinoda, Hisaaki Shimozu +1 more 2019-12-10
10236751 Method of manufacturing stator core Takayuki Akatsuka, Tadashi Morishima, Tooru Yamagiwa, Chidai Isaka, Motoyasu Mochizuki +2 more 2019-03-19
9660507 Method of manufacturing stator core and the stator core Tadashi Morishima, Katsumi Kinoshita, Takayuki Akatsuka, Hiroshi Horai, Yasuo Hirano +2 more 2017-05-23
6063640 Semiconductor wafer testing method with probe pin contact Masataka Mizukoshi, Hidehiko Akasaki, Masao Nakano, Yasuhiro Fujii, Shinnosuke Kamata +4 more 2000-05-16
5986377 Stator for dynamoelectric machine Tsutomu Kawamura, Naoki Mizutani, Toshikazu Sato, Kingo Miyaoka, Motoyasu Mochizuki 1999-11-16
5942831 Laminated core Shoji Fujimori 1999-08-24
5757226 Reference voltage generating circuit having step-down circuit outputting a voltage equal to a reference voltage Tetsuya Endo, Takaaki Suzuki, Hirohiko Mochizuki, Masao Taguchi 1998-05-26
5634367 Press forming device Tadasi Morisima, Nobutake Aikura 1997-06-03
5610863 Memory device having a booster circuit and a booster circuit control method 1997-03-11
5499213 Semiconductor memory device having self-refresh function Makoto Niimi, Shigemasa Ito, Yoshihiro Takemae, Yoshiharu Kato 1996-03-12
5349290 Method for testing semiconductor integrated circuit device, voltage drop power supply circuit suitable for the method, and semiconductor integrated circuit device having the voltage drop circuit 1994-09-20