Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6063640 | Semiconductor wafer testing method with probe pin contact | Masataka Mizukoshi, Hidehiko Akasaki, Masao Nakano, Yasuhiro Fujii, Shinnosuke Kamata +4 more | 2000-05-16 |