Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8531899 | Methods for testing a memory embedded in an integrated circuit | Shayan Zhang, James D. Burnett, Andrew C. Russell, Michael D. Snyder | 2013-09-10 |
| 8379466 | Integrated circuit having an embedded memory and method for testing the memory | Shayan Zhang, James D. Burnett, Andrew C. Russell, Michael D. Snyder | 2013-02-19 |