| 10528273 |
Dynamic compression in an electrically erasable programmble read only memory (EEPROM) emulation system |
Botang Shao |
2020-01-07 |
| 10109356 |
Method and apparatus for stressing a non-volatile memory |
Chen He, Richard K. Eguchi, Benjamin A. Schmid, Craig T. Swift, Yanzhuo Wang |
2018-10-23 |
| 9996458 |
Memory sector retirement in a non-volatile memory |
Botang Shao |
2018-06-12 |
| 9343172 |
Extended protection for embedded erase of non-volatile memory cells |
Chen He, Yanzhuo Wang |
2016-05-17 |
| 9240224 |
Non-volatile memory (NVM) with variable verify operations |
Yanzhuo Wang |
2016-01-19 |
| 9225356 |
Programming a non-volatile memory (NVM) system having error correction code (ECC) |
Chen He |
2015-12-29 |
| 9142315 |
Methods and systems for adjusting NVM cell bias conditions for read/verify operations to compensate for performance degradation |
Benjamin A. Schmid, Yanzhuo Wang |
2015-09-22 |
| 9082493 |
Adaptive erase methods for non-volatile memory |
Chen He, Yanzhuo Wang |
2015-07-14 |
| 9081708 |
Dynamic read scheme for high reliability high performance flash memory |
Yanzhou Wang |
2015-07-14 |
| 9030883 |
Adaptive erase recovery for non-volatile memory (NVM) systems |
Chen He, Yanzhuo Wang |
2015-05-12 |
| 8995202 |
Test flow to detect a latent leaky bit of a non-volatile memory |
Paul A Bogucki, Chen He |
2015-03-31 |
| 8995200 |
Non-volatile memory (NVM) with dynamically adjusted reference current |
Chen He, Yanzhuo Wang |
2015-03-31 |
| 8964482 |
Dynamic healing of non-volatile memory cells |
Chen He, Yanzhuo Wang |
2015-02-24 |
| 8947958 |
Latent slow bit detection for non-volatile memory |
Chen He, Peter Kuhn |
2015-02-03 |
| 8947940 |
Structure and method for healing tunnel dielectric of non-volatile memory cells |
Yanzhuo Wang |
2015-02-03 |
| 8902667 |
Methods and systems for adjusting NVM cell bias conditions for program/erase operations to reduce performance degradation |
Yanzhuo Wang, Chen He, Richard K. Eguchi |
2014-12-02 |
| 8879330 |
Non-volatile memory (NVM) with variable verify operations |
Yanzhuo Wang |
2014-11-04 |
| 8873316 |
Methods and systems for adjusting NVM cell bias conditions based upon operating temperature to reduce performance degradation |
Yanzhuo Wang |
2014-10-28 |
| 8830756 |
Dynamic detection method for latent slow-to-erase bit for high performance and high reliability flash memory |
Chen He |
2014-09-09 |
| 8760923 |
Non-volatile memory (NVM) that uses soft programming |
Yanzhuo Wang |
2014-06-24 |
| 8713406 |
Erasing a non-volatile memory (NVM) system having error correction code (ECC) |
Frank K. Baker, Jr., Chen He |
2014-04-29 |
| 8363491 |
Programming a non-volatile memory |
Yanzhuo Wang |
2013-01-29 |
| 8290759 |
Negative bias temperature instability in dynamic operation of an integrated circuit |
Lifeng Wu |
2012-10-16 |
| 7742340 |
Read reference technique with current degradation protection |
Marco A. Cabassi, Ronald J. Syzdek |
2010-06-22 |