ER

Edward A. Rietman

FS Flodesign Sonics: 10 patents #13 of 49Top 30%
AT AT&T: 6 patents #3,053 of 18,772Top 20%
IT Ibex Process Technology: 2 patents #3 of 5Top 60%
Overall (All Time): #236,157 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11515004 Thermodynamic measures on protein-protein interaction networks for cancer therapy Giannoula Lakka Klement 2022-11-29
10427956 Ultrasound and acoustophoresis for water purification Jason Dionne, Bart Lipkens 2019-10-01
10071383 High-volume fast separation of multi-phase components in fluid suspensions Jason Dionne, Bart Lipkens 2018-09-11
9796607 Phononic crystal desalination system and methods of use Bart Lipkens 2017-10-24
9695063 Combined acoustic micro filtration and phononic crystal membrane particle separation Bart Lipkens, Jason Dionne 2017-07-04
9421553 High-volume fast separation of multi-phase components in fluid suspensions Jason Dionne, Bart Lipkens 2016-08-23
9410256 Ultrasound and acoustophoresis for water purification Jason Dionne, Bart Lipkens 2016-08-09
9011699 Ultrasonic agglomeration of microalgae Jason Dionne, Jeff King, Bart Lipkens 2015-04-21
8956538 Phononic crystal desalination system and methods of use Bart Lipkens 2015-02-17
8691145 Ultrasound and acoustophoresis for water purification Jason Dionne, Bart Lipkens 2014-04-08
8679338 Combined acoustic micro filtration and phononic crystal membrane particle separation Bart Lipkens, Jason Dionne 2014-03-25
6904328 Large scale process control by driving factor identification Jill Card 2005-06-07
6810291 Scalable, hierarchical control for complex processes Jill Card 2004-10-26
6402590 Carrier head with controllable struts for improved wafer planarity Stephen A. Neston 2002-06-11
6021215 Dynamic data visualization Avinoam Kornblit, Nacer Layadi, Tseng-Chung Lee 2000-02-01
5877407 Plasma etch end point detection process Gardy Cadet, Dale E. Ibbotson, Tseng-Chung Lee 1999-03-02
5737496 Active neural network control of wafer attributes in a plasma etch process Robert C. Frye, Thomas Richard Harry, Earl R. Lory 1998-04-07
5653894 Active neural network determination of endpoint in a plasma etch process Dale E. Ibbotson, Tseng-Chung Lee, Helen L. Maynard 1997-08-05
5467883 Active neural network control of wafer attributes in a plasma etch process Robert C. Frye, Thomas Richard Harry, Earl R. Lory 1995-11-21