| 11315756 |
Fiducial design for tilted or glancing mill operations with a charged particle beam |
Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt, Hyun Hwa Kim |
2022-04-26 |
|
| 10825651 |
Automated TEM sample preparation |
Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more |
2020-11-03 |
|
| 10340119 |
Automated TEM sample preparation |
Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more |
2019-07-02 |
|
| 10283317 |
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella |
Paul Keady, Brennan Peterson, Guus Das, Craig Henry, Larry Dworkin +2 more |
2019-05-07 |
|
| 10026590 |
Fiducial design for tilted or glancing mill operations with a charged particle beam |
Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt, Hyun Hwa Kim |
2018-07-17 |
|
| 9741536 |
High aspect ratio structure analysis |
Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt |
2017-08-22 |
|
| 9696372 |
Multidimensional structural access |
Jeffrey Blackwood, Sang Hoon Lee, Michael Schmidt, Karey Holland |
2017-07-04 |
|
| 9653260 |
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella |
Paul Keady, Brennan Peterson, Guus Das, Craig Henry, Larry Dworkin +2 more |
2017-05-16 |
|
| 9601313 |
Automated TEM sample preparation |
Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more |
2017-03-21 |
|
| 9488554 |
Method and system for reducing curtaining in charged particle beam sample preparation |
Michael Schmidt, Hyun Hwa Kim, Sang Hoon Lee, Jeffrey Blackwood |
2016-11-08 |
|
| 9412560 |
Bulk deposition for tilted mill protection |
Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt |
2016-08-09 |
$13,285,000 |
| 9384982 |
Depositing material into high aspect ratio structures |
Sang Hoon Lee, Jeffrey Blackwood |
2016-07-05 |
$15,047,000 |
| 9336985 |
Method for creating S/TEM sample and sample structure |
Jeffrey Blackwood |
2016-05-10 |
$10,002,000 |
| 9279752 |
Method for preparing thin samples for TEM imaging |
Michael Moriarty, Jeffrey Blackwood |
2016-03-08 |
$9,474,000 |
| 9263306 |
Protective layer for charged particle beam processing |
Jeff Blackwood |
2016-02-16 |
$8,478,000 |
| 9111720 |
Method for preparing samples for imaging |
Ronald Kelley, Michael Moriarty, Jeffrey Blackwood |
2015-08-18 |
$9,332,000 |
| 9006651 |
Method for creating S/TEM sample and sample structure |
Jeffrey Blackwood |
2015-04-14 |
$9,203,000 |
| 8912490 |
Method for preparing samples for imaging |
Ronald Kelley, Michael Moriarty, Jeffrey Blackwood |
2014-12-16 |
$6,985,000 |
| 8859963 |
Methods for preparing thin samples for TEM imaging |
Michael Moriarty, Jeff Blackwood |
2014-10-14 |
$6,500,000 |
| 8822921 |
Method for preparing samples for imaging |
Michael Schmidt, Jeffrey Blackwood, Sang Hoon Lee, Ronald Kelley |
2014-09-02 |
$6,392,000 |
| 8729469 |
Multiple sample attachment to nano manipulator for high throughput sample preparation |
Michael Schmidt, Corey Senowitz |
2014-05-20 |
$16,172,000 |
| 8536525 |
Method for creating S/TEM sample and sample structure |
Jeff Blackwood |
2013-09-17 |
$17,435,000 |
| 8525137 |
Method for creating S/TEM sample and sample structure |
Jeff Blackwood, Jason Arjavac |
2013-09-03 |
$16,843,000 |
| 8134124 |
Method for creating S/tem sample and sample structure |
Jeff Blackwood |
2012-03-13 |
$13,247,000 |
| 8097308 |
Protective layer for charged particle beam processing |
Jeff Blackwood |
2012-01-17 |
$14,197,000 |