Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11315756 | Fiducial design for tilted or glancing mill operations with a charged particle beam | Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt, Hyun Hwa Kim | 2022-04-26 |
| 10825651 | Automated TEM sample preparation | Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more | 2020-11-03 |
| 10340119 | Automated TEM sample preparation | Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more | 2019-07-02 |
| 10283317 | High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella | Paul Keady, Brennan Peterson, Guus Das, Craig Henry, Larry Dworkin +2 more | 2019-05-07 |
| 10026590 | Fiducial design for tilted or glancing mill operations with a charged particle beam | Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt, Hyun Hwa Kim | 2018-07-17 |
| 9741536 | High aspect ratio structure analysis | Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt | 2017-08-22 |
| 9696372 | Multidimensional structural access | Jeffrey Blackwood, Sang Hoon Lee, Michael Schmidt, Karey Holland | 2017-07-04 |
| 9653260 | High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella | Paul Keady, Brennan Peterson, Guus Das, Craig Henry, Larry Dworkin +2 more | 2017-05-16 |
| 9601313 | Automated TEM sample preparation | Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard Young +3 more | 2017-03-21 |
| 9488554 | Method and system for reducing curtaining in charged particle beam sample preparation | Michael Schmidt, Hyun Hwa Kim, Sang Hoon Lee, Jeffrey Blackwood | 2016-11-08 |
| 9412560 | Bulk deposition for tilted mill protection | Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt | 2016-08-09 |
| 9384982 | Depositing material into high aspect ratio structures | Sang Hoon Lee, Jeffrey Blackwood | 2016-07-05 |
| 9336985 | Method for creating S/TEM sample and sample structure | Jeffrey Blackwood | 2016-05-10 |
| 9279752 | Method for preparing thin samples for TEM imaging | Michael Moriarty, Jeffrey Blackwood | 2016-03-08 |
| 9263306 | Protective layer for charged particle beam processing | Jeff Blackwood | 2016-02-16 |
| 9111720 | Method for preparing samples for imaging | Ronald Kelley, Michael Moriarty, Jeffrey Blackwood | 2015-08-18 |
| 9006651 | Method for creating S/TEM sample and sample structure | Jeffrey Blackwood | 2015-04-14 |
| 8912490 | Method for preparing samples for imaging | Ronald Kelley, Michael Moriarty, Jeffrey Blackwood | 2014-12-16 |
| 8859963 | Methods for preparing thin samples for TEM imaging | Michael Moriarty, Jeff Blackwood | 2014-10-14 |
| 8822921 | Method for preparing samples for imaging | Michael Schmidt, Jeffrey Blackwood, Sang Hoon Lee, Ronald Kelley | 2014-09-02 |
| 8729469 | Multiple sample attachment to nano manipulator for high throughput sample preparation | Michael Schmidt, Corey Senowitz | 2014-05-20 |
| 8536525 | Method for creating S/TEM sample and sample structure | Jeff Blackwood | 2013-09-17 |
| 8525137 | Method for creating S/TEM sample and sample structure | Jeff Blackwood, Jason Arjavac | 2013-09-03 |
| 8134124 | Method for creating S/tem sample and sample structure | Jeff Blackwood | 2012-03-13 |
| 8097308 | Protective layer for charged particle beam processing | Jeff Blackwood | 2012-01-17 |