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High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella |
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| 9653260 |
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella |
Paul Keady, Brennan Peterson, Guus Das, Craig Henry, Larry Dworkin +2 more |
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| 9263306 |
Protective layer for charged particle beam processing |
Stacey Stone |
2016-02-16 |
| 8859963 |
Methods for preparing thin samples for TEM imaging |
Michael Moriarty, Stacey Stone |
2014-10-14 |
| 8536525 |
Method for creating S/TEM sample and sample structure |
Stacey Stone |
2013-09-17 |
| 8525137 |
Method for creating S/TEM sample and sample structure |
Stacey Stone, Jason Arjavac |
2013-09-03 |
| 8134124 |
Method for creating S/tem sample and sample structure |
Stacey Stone |
2012-03-13 |
| 8097308 |
Protective layer for charged particle beam processing |
Stacey Stone |
2012-01-17 |
| 7675049 |
Sputtering coating of protective layer for charged particle beam processing |
Michael Schmidt |
2010-03-09 |
| 6847123 |
Vertically staggered bondpad array |
— |
2005-01-25 |
| 6747464 |
Wafer holder for backside viewing, frontside probing on automated wafer probe stations |
— |
2004-06-08 |
