Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5951702 | RAM-like test structure superimposed over rows of macrocells with added differential pass transistors in a CPU | Hank H. Lim, Earl T. Cohen, Jengwei Pan, James S. Blomgren | 1999-09-14 |
| 5732209 | Self-testing multi-processor die with internal compare points | Louis S. Lederer, James S. Blomgren | 1998-03-24 |