Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6992781 | Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device | Hiroyuki Okada, Tadahiro Echigo, Shigeki Naka, Hiroyoshi Onnagawa | 2006-01-31 |
| RE38215 | Polishing apparatus | Toyomi Nishi, Hidetaka Nakao, Tetsuji Togawa | 2003-08-12 |
| 6074276 | Polishing apparatus | Toyomi Nishi, Hidetaka Nakao, Tetsuji Togawa | 2000-06-13 |
| 5885134 | Polishing apparatus | Toyomi Nishi, Hidetaka Nakao, Tetsuji Togawa | 1999-03-23 |