Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823550 | Optical position measuring device | Karsten Sändig | 2020-11-03 |
| 10048114 | Device for measuring the vibrational amplitude of a capillary tube of a wire bonder | Wolfgang Holzapfel | 2018-08-14 |
| 9823058 | Device for position determination | Wolfgang Holzapfel, Ralph Joerger | 2017-11-21 |
| 9739598 | Device for interferential distance measurement | Ralph Joerger | 2017-08-22 |
| 9638514 | Optical position-measuring device | — | 2017-05-02 |
| 9400168 | Device for distance measurement | Ralph Joerger, Wolfgang Holzapfel | 2016-07-26 |
| 9080857 | Device for interferential distance measurement | Birgit Lange, Michael Hermann | 2015-07-14 |
| 8822907 | Optical position-measuring device having two crossed scales | Ralph Joerger, Michael Hermann, Wolfgang Holzapfel | 2014-09-02 |
| 8797546 | Interferometric distance measurement device using a scanning plate and transparent carrier substrate containing a reflector element | Ralph Joerger | 2014-08-05 |
| 8465805 | Glass veneer on ceramics | — | 2013-06-18 |
| 7701593 | Optical position measuring arrangement | Wolfgang Holzapfel, Erwin Spanner | 2010-04-20 |
| 7297935 | Position-measuring device | — | 2007-11-20 |
| 7271920 | Position-measuring device | Sebastian Tondorf | 2007-09-18 |
| 7196431 | Device for prompting a controller | Gerhard Eckert, Gerhard Nagel, Hans-Peter Schoener | 2007-03-27 |
| 7159781 | Scanning unit for a position measuring device | Volker Hoefer | 2007-01-09 |
| 7154609 | Interferential position measuring arrangement | Wolfgang Holzapfel, Michael Hermann, Volker Hofer, Ulrich Benner, Karsten Sändig | 2006-12-26 |
| 6943341 | Position measuring system | Udo Linnemann, Wolfgang Holzapfel | 2005-09-13 |
| 6621069 | Optical encoder with an electric field—screening grit | Wolfgang Holzapfel, Sebastian Tondorf, Peter Pechak, Herbert Mauerberger, Franz Obermaier +1 more | 2003-09-16 |
| 6552810 | Optical measuring system | Michael Hermann, Wolfgang Holzapfel, Volker Hofer | 2003-04-22 |
| 6541761 | Optical position measuring system with a graduation that causes essentially only first orders of diffraction | Wolfgang Holzapfel | 2003-04-01 |
| 6511921 | Methods for reducing the reactivity of a semiconductor substrate surface and for evaluating electrical properties of a semiconductor substrate | Christopher Alan Panczyk, Jonathan M. Madsen | 2003-01-28 |
| 6198534 | Scanning unit for an optical position measuring system | Volker Hofer, Wolfgang Holzapfel, Elmar Mayer | 2001-03-06 |
| 6175414 | Optical position measuring device | Wolfgang Holzapfel, Volker Hofer | 2001-01-16 |
| 6151128 | Optical position indicator | — | 2000-11-21 |
| 5760959 | Interferential position measuring device with three detectors | Dieter Michel | 1998-06-02 |