DM

Dieter Michel

DG Dr. Johannes Heidenhain Gmbh: 23 patents #7 of 417Top 2%
JG Johannes Heidenhain Gmbh: 1 patents #38 of 95Top 40%
📍 Traunstein, DE: #1 of 128 inventorsTop 1%
Overall (All Time): #156,372 of 4,157,543Top 4%
26
Patents All Time

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDate
6885457 Rotary position measuring system Wolfgang Holzapfel 2005-04-26
6621104 Integrated optoelectronic thin-film sensor and method of producing same Peter Speckbacher 2003-09-16
6605828 Optoelectronic component with a space kept free from underfiller Günter Schwarzrock, Reiner Burgschat, Andreas Schmidt, Wolfgang Brode, Wolfgang Holzapfel +1 more 2003-08-12
6486467 Optical detector for measuring relative displacement of an object on which a grated scale is formed Peter Speckbacher 2002-11-26
5880882 Scale and method for making a scale Georg Flatscher 1999-03-09
5760959 Interferential position measuring device with three detectors Walter Huber 1998-06-02
5631736 Absolute interferometer measuring process and apparatus having a measuring interferometer, control interferometer and tunable laser Jurgen Thiel, Andreas Franz 1997-05-20
5559599 Graduation scale having a continuous planar surface with a protective diffusion barrier layer thereon 1996-09-24
5521704 Apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser Jurgen Thiel, Andreas Franz 1996-05-28
5396328 Waveguide type displacement interferometer having two reference paths Dieter Jestel, Andreas Franz 1995-03-07
5333048 Polarizing interferometric displacement measuring arrangement Erwin Spanner 1994-07-26
5162869 Apparatus and method having at least one waveguide coupler to create at least two signals having a mutual phase shift not equal to 180 degrees Andreas Franz 1992-11-10
5113066 Integrated optical sensor arrangement with detecting means, and means for controlling the optical emission wavelength of the light beam source Andreas Franz 1992-05-12
5079418 Position measuring apparatus with reflection Erwin Spanner 1992-01-07
5061073 Photoelectric position measuring arrangement 1991-10-29
5001340 Angle measuring arrangement Ernst Schwefel, Olivier Pariaux 1991-03-19
4988864 Photoelectric angle measuring device with adjacent order interference Walter Huber 1991-01-29
4955718 Photoelectric measuring system with integrated optical circuit including and illuminating system 1990-09-11
4923300 Defraction photoelectric position measuring system Olivier Parriaux, Guy Voirin 1990-05-08
4843237 Photoelectric length and angle measuring device 1989-06-27
4778273 Photoelectric measuring system 1988-10-18
4766310 Photoelectric position measuring instrument with grids 1988-08-23
4677293 Photoelectric measuring system 1987-06-30
4512083 Measuring apparatus Walter Schmitt 1985-04-23
4505580 Method and apparatus for generating exposure masks 1985-03-19