ES

Erwin Spanner

DG Dr. Johannes Heidenhain Gmbh: 15 patents #17 of 417Top 5%
JG Johannes Heidenhain Gmbh: 2 patents #21 of 95Top 25%
Robert Bosch Gmbh: 1 patents #10,465 of 19,740Top 55%
📍 Traunstein, DE: #2 of 128 inventorsTop 2%
Overall (All Time): #256,518 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
9733068 Optical position measuring device Jörg Drescher, Wolfgang Holzapfel, Ralph Joerger, Thomas Kälberer, Markus Meissner +1 more 2017-08-15
9188424 Interferometer Wolfgang Holzapfel, Joerg Drescher, Markus Meissner, Ralph Joerger, Bernhard Musch +1 more 2015-11-17
7701593 Optical position measuring arrangement Wolfgang Holzapfel, Walter Huber 2010-04-20
7639366 Position-measuring device for determining the position of two objects movable with respect to each other along a measuring direction, and method for forming a reference pulse for such a position-measuring device 2009-12-29
7542149 Optics system for an interferometer that uses a measuring mirror, a reference mirror and a beam deflector Herbert Huber-Lenk 2009-06-02
6907372 Device for position indication and detection of guidance errors 2005-06-14
6535290 Optical position measuring device with a beam splitter Jurgen Thiel 2003-03-18
6369951 Beam splitter assembly and interferometer having a beam splitter assembly 2002-04-09
6265992 Position measuring system and method for operating a position measuring system Rainer Hagl, Mathias Hausschmid, Jurgen Thiel, Johann Streitwieser 2001-07-24
6097318 Position measuring system and method for operating a position measuring system Rainer Hagl, Mathias Hausschmid, Jurgen Thiel, Johann Streitwieser 2000-08-01
5977539 Optical position-measuring device having reference mark graduation structures with chirp fields Wolfgang Holzapfel 1999-11-02
5786931 Phase grating and method of producing phase grating Peter Speckbacher, Georg Flatscher, Michael Allgauer, Erich Bayer, Andreas Franz 1998-07-28
5711084 Linear encoder Peter Pechak 1998-01-27
5574560 Dual-beam interferometer with a phase grating Andreas Franz 1996-11-12
5500734 Photoelectric position measuring system with integral optical circuit having phase shifted interference gratings 1996-03-19
5333048 Polarizing interferometric displacement measuring arrangement Dieter Michel 1994-07-26
5206704 Position measuring apparatus and method of use thereof Walter Huber 1993-04-27
5079418 Position measuring apparatus with reflection Dieter Michel 1992-01-07