Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6388927 | Direct bit line-bit line defect detection test mode for SRAM | Jonathan F. Churchill, Cathal G. Phelan, Ashish Pancholy, Gary A. Gibbs | 2002-05-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6388927 | Direct bit line-bit line defect detection test mode for SRAM | Jonathan F. Churchill, Cathal G. Phelan, Ashish Pancholy, Gary A. Gibbs | 2002-05-14 |