AF

Aurélien Fay

CEA: 2 patents #2,014 of 7,956Top 30%
AN Aselta Nanographics: 1 patents #11 of 14Top 80%
Overall (All Time): #1,900,133 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10573492 Calibration of elementary small patterns in variable-shaped-beam electron-beam lithography Jacky Chartoire 2020-02-25
10423074 Method for calculating the metrics of an IC manufacturing process Mohamed Saib, Patrick J. Schiavone, Thiago Figueiro 2019-09-24