Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10578978 | Method for determining the dose corrections to be applied to an IC manufacturing process by a matching procedure | Mohamed Saib, Patrick J. Schiavone, Sébastien Bayle | 2020-03-03 |
| 10553394 | Method for the correction of electron proximity effects | Nader JEDIDI, Patrick J. Schiavone, Jean-Herve Tortai | 2020-02-04 |
| 10522328 | Method of performing dose modulation, in particular for electron beam lithography | Mohamed Saib, Patrick J. Schiavone | 2019-12-31 |
| 10423074 | Method for calculating the metrics of an IC manufacturing process | Mohamed Saib, Aurélien Fay, Patrick J. Schiavone | 2019-09-24 |
| 10295912 | Method for determining the parameters of an IC manufacturing process model | Mohamed Saib, Patrick J. Schiavone | 2019-05-21 |
| 10156796 | Method for determining the parameters of an IC manufacturing process by a differential procedure | Mohamed Saib, Patrick J. Schiavone | 2018-12-18 |
| 9934336 | Method of correcting electron proximity effects using Voigt type scattering functions | Jean-Herve Tortai, Patrick J. Schiavone, Nader JEDIDI | 2018-04-03 |
| 9224577 | Method for correcting electronic proximity effects using off-center scattering functions | Patrick J. Schiavone | 2015-12-29 |