Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11909607 | Maintaining consistent measurement intervals of MEF 35.1 performance monitoring (PM) sessions in a history database | Aditya Yadav, Jai Kumar | 2024-02-20 |
| 11630197 | Determining a motion state of a target object | Jayakrishnan Unnikrishnan, Avdhut JOSHI, Amir Salimi, Sree Sesha Aravind VADREVU, Gautam SACHDEVA +6 more | 2023-04-18 |
| 11461915 | Object size estimation using camera map and/or radar information | Jayakrishnan Unnikrishnan, Avdhut JOSHI, Yoga Y NADARAAJAN, Amir Salimi, Urs Niesen +2 more | 2022-10-04 |
| 11454949 | Auto-correlation of wafer characterization data and generation of composite wafer metrics during semiconductor device fabrication | Hariharasudhan Koteeswaran, Priyank Paras Jain, Suvi Murugan, Yuan Zhong | 2022-09-27 |
| 11393118 | Metrics for asymmetric wafer shape characterization | Priyank Paras Jain, Yuan Zhong, Chiou Shoei Chee | 2022-07-19 |
| 10957608 | Guided scanning electron microscopy metrology based on wafer topography | Arpit Yati, Jagdish Chandra Saraswatula, Andrew Cross | 2021-03-23 |
| 10171358 | Port congestion resiliency in a multi-card and multi-switch link aggregation group | Anubhav Saksena, Rajeev Chandwani | 2019-01-01 |
| 10015101 | Per queue per service buffering capability within a shaping window | Himanshu PREMI, Tushar Ruhela | 2018-07-03 |
| 9838320 | Optimum utilization of green tokens in packet metering | — | 2017-12-05 |
| 9807022 | Optimum utilization of yellow tokens in packet metering | — | 2017-10-31 |